Earth sciences, mineral resources, energy and other resources

As a mass-produced product, it is possible to manufacture paper cost effectively if the ratio of fibres and filler material is optimised without the changing the mechanical and printing properties. In this respect it is important to examine the distribution of fibre and filler material in the paper both during the paper development and production. The exceptionally robust analytic systems from JEOL can be used during challenging routine operation for artifact-free preparation, as well as for the precise morphological and chemical characterisation of cellulose.

Facing cut through a sheet of paper

Source data: JEOL (Germany) GmbH

Asbestos was used for decades as a fire- and temperature-proof raw and insulation material. Once the health risks were discovered, many laboratories examined potentially asbestos-containing construction materials. JEOL is the only manufacturer to offer the powerful combination of its own electron microscopes and own spectrometers as a complete solution for standards-compliant asbestos analysis.

Identification of a chrysotile fibre by means of SEM imaging and EDX spectrum

Bildquelle: JED-Broschüre

Modern paintwork is usually a multi-layer system. In the case of macroscopically visible paint defects, it is very important to be able to determine the layer in which the cause of the defect lies. JEOL preparation systems enable the simple and reproducible production of artifact-free cross-sections.

Cross-section of a painted metal surface. The diameter of the inclusion is approx. 10 µm.

Source data: JEOL Ltd., CP brochure

Li batteries are used in mobile phones or vehicles, among other things. Thanks to the newly developed light element spectrometer from JEOL, detecting in a microscope has for the first time become routine and standard with high spatial resolution and detection sensitivity.

Identification of lithium in an Li-ion battery

Source data: JEOL Ltd., SXES brochure

The formation of precipitates is used systematically to define the mechanical properties of a metallic structure. However, as a form of contamination, these can also be undesired. In order to be able to judge the quality of an alloy, it is necessary to determine the morphology and chemical composition of the precipitates. This is why JEOL supplies all-round, complete solutions, from artifact-free sample preparation to high-resolution analysis from the µm to the nm level.

Element mapping image of a brass alloy

Source data: JEOL (Germany) GmbH

Fibres are used in many branches of industry, e.g. in textile processing or as a structural material in mechanical engineering. Their structural properties can be studied by means of a fibre cross-section, for example. JEOL supplies an established and powerful complete solution for simple, artifact-free preparation and high-resolution imaging and analytics.

SEM image of a cross-section through a fibre bundle

Source data: JEOL Ltd., Ion Slicer brochure

Fossil fuels such as Diesel are highly complex mixtures of a wide range of linear, cyclic and aromatic hydrocarbons. Separating theses and thus unequivocally determining the constituents of the fuel is therefore of crucial importance. The combination of special, two-dimensional GC techniques allows JEOL systems to quickly deliver exact structural information.

Two-dimensional total ion current chromatogram (TICC) of diesel fuel by GCxGC/TOFMS; separation after boiling point (abscissa) and polarity (ordinate)

Source data: JEOL Ltd., JMS-T200GC AccuTOF GCx brochure, page 4

The precise determination of gases with minimal differences in their atomic masses is an important task in the production of technical gases. It is not possible to exactly determine all the constituents of a gas mixture with conventional mass spectrometers. The special high-performance mass spectrometers from JEOL enable the determination and analysis of all gaseous, chemical compounds, including atomic hydrogen.

Identification of H2 and H in the mass spectrum of a gas mixture

Source data: JEOL Ltd., JMS-MT3010HRGA brochure, page 3

To achieve the high-resolution imaging and analytics of biological samples, it is often necessary to examine the sample in its native state. Thanks to the patented JEOL Aqua Cover, it is even possible to image moist or hydrated samples in a scanning electron microscope at low pressure.

Image of a water droplet on the surface of a rose petal

Source data: JEOL Ltd. (Aqua Cover presentation)

The detection of rare earths is not only of interest for mineralogical samples, it is also becoming increasingly significant due to the continuous development of high-performance microelectronics. For decades, JEOL has been setting the bar for detecting the mostly low-concentrated elements with its energetically and spatially high-resolution trace element analytics.

Rare earths as an example of trace element analysis

Source data: JEOL (Germany) GmbH, Demoreport Uni. Vienna (JXA)

Minerals are frequently complex structures formed from a multitude of elements. Element mapping images are one of the most important methods for achieving the spatially resolved visualisation of the chemical composition. These mapping images can be used to gather essential information on e.g. the creation and structure of the samples under examination. For this task, JEOL supplies the most stable and most energetically and spatially high-resolution spectroscopy systems.

Element mapping images of a symplectite microsection

Source data: JEOL (Germany) GmbH, Demoreport Uni. Vienna (JXA)

As a widespread fuel, petroleum comprises a mixture of liquid hydrocarbons. It is very difficult to perform molecular analysis on it with standard mass spectrometric methods. JEOL systems are capable of determining the molecular weight without fragmentation in a quick, uncomplicated manner by soft ionisation.

Mass spectra of an n-alkane, imaged with field ionisation (top) and electron impact ionisation (bottom)

Source data: JEOL Ltd., 200GC-Petroleum_and_Petrochemical_Solutions brochure

High-resolution element maps are of central significance for understanding geological processes. Over many decades, JEOL electron probe microanalyzers have proven to be the perfect tool for the reliable, automated examination of diffusion profiles and the spatial distribution of trace elements. Our detection threshold for this non-destructive method is less than 20 ppm.

Element mapping images of a rock sample

Source data: JEOL (Germany) GmbH, Geoforschungszentrum Potsdam

In modern semiconductor components, complex, functional structures have to be installed in an ever smaller space. In order to be able to reliably pinpoint and identify faults, it is essential to analyse precisely the structure and the element map. With the automated systems from JEOL, it is possible to prepare, image and analyse semiconductor components for faults precisely with the greatest accuracy.

Three-dimensional element map of a NAND circuit

Source data: JEOL Ltd., JEM-2800 brochure/presentation

More and more frequently, innovative materials are being tailor-made to their areas of application. Such precise modifications frequently occur even down to the nanoscale. Characterising such sensitive surfaces places the highest of demands on the imaging device. The high-resolution scanning electron microscopes from JEOL routinely operate within this threshold range.

Surface image of a zeolite compound

Source: JEOL Ltd.