Second-hand Equipment

The compact efficiency class of NMR instruments with 400 Hz.

With over 60 years of experience, JEOL is the oldest NMR manufacturer in the world. JEOL instruments are among the fastest, most stable, reliable, and robust devices available on the market. With the JNM-ECZS400, JEOL not only offers the world’s most compact NMR spectrometer but also an award-winning one.

• High-performance spectrometer in a compact, award-winning design
• Valid analysis of solid and liquid samples
• 43% reduced floor area of the main chassis compared to similar instruments
• Highly sensitive auto-tune probes
• State-of-the-art superconducting magnet with minimal stray fields and drift rates
• Highly reliable hardware + modern software + premium service = your optimised workflow

If you are interested in this instrument or have special requests, please contact us at slsjld or use our contact form. We are happy to offer the appropriate service contract for our used equipment as well.
We look forward to your inquiry!

Versatile, high throughput SEM from JEOL combined with the intuitive operation of a table-top SEM.

The InTouchScope JSM-IT200 features all the capabilities of a full size tungsten SEM with integrated EDS analysis in a small, ergonomic and intuitive design. It is very easy to install since neither cooling water nor gas is necessary.

Practical features for users of all levels:

• high resolution imaging in HV/LV/SE/BSE
• Zeromag-mode for intuitive transition from light-optic to SEM image
• chemical analysis with optional integrated EDS and live analysis
• multi-touch screen control and wireless operation
• automatic SEM condition setup based on sample type
• simultaneous multiple live image and movie capture
• fast sample navigation at 5x – 300,000x magnifications
• Smile View Premium Offline-Software with image sharpening, montaging, position alignment and overlay
• Compact floor space: ca. 0,5m²

If you are interested in this instrument or have special requests, please contact us at slsjld or use our contact form. We are happy to offer the appropriate service contract for our used equipment as well.
We look forward to your inquiry!

Built off of the highly successful predecessor of our InTouchScope™ series SEMs, the JSM-IT700HR was developed to meet increasing demands in the market place. This SEM breaks through the conventional general-purpose SEM in terms of high resolution imaging and high spatial-resolution analysis, by incorporating a high-brightness electron gun.

Increase your productivity with our fully-integrated software, from specimen navigation to analysis to report creation.

• Zeromag function links holder graphics, CCD and SEM images to simplify sample navigation.
• Live Analysis, our embedded EDS system, shows real time EDS spectra during image observation for efficient elemental analysis.
• SMILE VIEW™ Lab, enabling integrated management of image and analysis data, facilitates report generation for all data.
• Specimen Exchange Navi enables safe and simple specimen exchange.
• With the newly-developed Auto Beam Alignment function, the electron optical conditions are always kept optimum.
• Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.
• Compact design with small footprint.

If you are interested in this instrument or have special requests, please contact us at slsjld or use our contact form. We are happy to offer the appropriate service contract for our used equipment as well.
We look forward to your inquiry!

The field emission scanning electron microscope JSM-IT800SHL perfectly combines highest resolution and versatility with intuitive handling and most convenient automation.

The JSM-IT800SHL is a high-end field-emission SEM for a wide range of applications:

• Highest resolution imaging and analysis, even for magnetic or insulating materials, using a Super Hybrid Lens (SHL)..
• Extremely fast analysis with a high specimen current of ≥ 300 nA.
• Maximum stability and continuously adjustable current through the in-lens Schottky Plus field emission electron source and the dual condenser lens system.
• Quick transitions between different operating modes through the new "NeoEngine" and improved auto-functions.
• Extreme depth of field and distortion-free imaging of large sample structures through unique lens optics.
• Fast and safe exchange of large specimens through the specimen chamber.
• Stepless transition between optical and SEM imaging for the easiest sample navigation using the JEOL ZeroMag function.
• New backscattered electron detectors enable a tailor-made, application-oriented configuration of the system, e.g. a flexible 6-segment detector or a highly sensitive scintillator detector.
• Live functions include live EDS analyses and live EDS mappings.
• Full integration of the JEOL EDS system, including live EDS for maximum usability and intuitive reporting of all recorded measurement data. In addition to conventional EDS detectors with windows, JEOL also offers its own geometry-optimized and windowless EDS detector ("Gather-X") for analyses of light elements and high-speed mappings.
• For the examination of non-conductive materials, a flexible low-vacuum system is available.

If you are interested in this instrument or have special requests, please contact us at slsjld or use our contact form. We are happy to offer the appropriate service contract for our used equipment as well.
We look forward to your inquiry!

The JSM-IT800is Field Emission Scanning Electron Microscope combines highest resolution and versatility with intuitive handling. The JSM-IT800is covers a broad range of applications, offering a high level of automation.

The FE-SEM JSM-IT800is enables high performance and ease-of-use:

• Extremely fast analysis with a high specimen current of ≥ 300 nA.
• Unmatched stability and continuously adjustable current, achieved through the in-lens Schottky Plus field emission electron source and the dual condenser lens system.
• Rapid transitions between different operating modes enabled by the new "NeoEngine" and enhanced autofunctions.
• Exceptional depth of field and distortion-free imaging of large sample structures, facilitated by unique lens optics.
• Seamless transition between optical and SEM imaging for the simplest sample navigation, enabled by the JEOL ZeroMag function.
• New backscattered electron detectors allow for a tailored, application-oriented of the system, e.g. a flexible 6-segment detector or a highly sensitive scintillator detector.
• Live functions include live EDS analysis and live EDS mapping.
• Full integration of the JEOL EDS system, including live EDS, for maximum usability and intuitive reporting of all recorded measurement data.
• For the examination of non-conductive materials, a flexible low-vacuum system is available.

If you are interested in this instrument or have special requests, please contact us at slsjld or use our contact form. We are happy to offer the appropriate service contract for our used equipment as well.
We look forward to your inquiry!

Innovative desktop scanning electron microscope with a fully hard- and software-integrated energy-dispersive X-ray spectrometer (EDS) including a low-vacuum mode for non-conductive samples. Fully functional setup from our applications laboratory.

• “Live 3D”: real-time SEM image and reconstructed 3D surface for simultaneous acquisition of topographic depth information and surface fine structures.
• Full-featured electron optics for magnifications up to x100,000. Straightforward emitter change provided by pre-centered tungsten filaments.
• Automatic condition setting based on sample type and application ensures high quality results and enhances productivity.
• JEOL ZeroMag for seamless transition between light optical & SEM imaging dramatically improves handling and through-put.
• Fully integrated JEOL EDS system including live EDS for maximum ease of use and comprehensive report generation.
• Automated acquisition of SEM images and elemental distribution maps resulting in high resolution montages.
• Challenging samples can be investigated in low-vacuum mode with the push of a button.
• Large chamber for samples of up to 80 mm diameter and 50 mm height.
• Simple installation – an electric socket and you are ready to go!
• Compact design for mobile applications.

If you are interested in this instrument or have special requests, please contact us at slsjld or use our contact form. We are happy to offer the appropriate service contract for our used equipment as well.
We look forward to your inquiry!

Easy-to-operate preparation system for the production of specimen cross-sections for SEM, EPMA and auger applications.

Simplifying work in sample preparation:

• High throughput: high-speed ion source and auto start function
• Auto processing programs: High-speed processing and finishing, intermittent processing
• Ease of setup: through modularized function holder
• Multi-purpose stage for planar surface milling and polishing and ion beam sputter coating
• Highly-durable shield

If you are interested in this instrument or have special requests, please contact us at slsjld or use our contact form. We are happy to offer the appropriate service contract for our used equipment as well.
We look forward to your inquiry!