JEOL SXES - Soft X-Ray Emission Spectrometer

The SXES is a powerful high energy resolution spectrometer for light element analysis. It is designed for use with the microprobe as part of an integrated analytical system or stand-alone detector. Use of the SXES enables low voltage analysis at <1kV, spectral mapping with high energy resolution, fast parallel detection, and chemical state analysis.

• High Energy Resolution Spectral Mapping
  The SXES allows for direct observation of the Li-K emission for the first time. It is even capable of mapping the different chemical states within a Li-battery that result from different degrees of charging. Two different Li-K emission lines can be mapped. The intensity of the lower energy Li-K line corresponds to the degree of charging, and the higher energy Li-K line corresponds to the amount of metallically bonded Li.
  
  
• Fast Parallel Detection
  A newly developed aberration corrected grating system and a high sensitivity X-ray CCD allow the SXES to simultaneously collect a full energy spectrum.
  
  
• Chemical State Analysis
  With the SXES, chemical state analysis is comparable to that of XPS or EELS. The SXES has an energy resolution of only 0.3 eV, as demonstrated using the Fermi-edge of the Al-L emission of Al metal.
  
  
• Li Detection: Peak shape in compounds
  In metallic Li, a single K-line is detected. In Li-compounds, an additional satellite peak can occur depending on the occupancy of the valence band.